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QSS 069 (OTTO) Quartz substrate, thickness 1.0 mm, size 10 × 10 mm - applications in semiconductor and optical device fabrication.
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Certificate Of Analysis
(For eg. B 1615-0108)
Other Documents
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Silicon wafer, single crystal, dia x thickness 3 in x 0.1 mm
Silicon wafer (single side polished), <111>, N-type, contains phosphorus as dopant, diam. x thickness 2 in. x 0.275 mm
Plano Convex Spherical Lens, Dia 25.4mm, Focal Length 75mm, AR @ 880 nm
Plano Convex Spherical Lens, Dia 38.1mm, Focal Length 50mm, AR @ 532 nm
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DisclaimerThe above particulars do not release the customer from the obligation to carry out an inspection of goods received. Not for medical, household or any other uses, for lab use only, Please test before use.