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Certificate Of Analysis
(For eg. B 1615-0108)
Other Documents
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7440-02-0
Nickel sputtering target, diam. x thickness 50.6 mm x 3 mm, 99.99%
409-21-2
Silicon carbide (4H-SiC Epitaxial Wafer) wafers, dia 101 mm, thick 0.35 mm
1304-82-1
Bismuth(III) telluride, 99.98%
78-08-0
Triethoxyvinylsilane, 99%
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DisclaimerThe above particulars do not release the customer from the obligation to carry out an inspection of goods received. Not for medical, household or any other uses, for lab use only, Please test before use.